Non-resonant frequency components observed in a dynamic Atomic Force Microscope
Author:
Affiliation:
1. Dept. of Electrical, Electronics and Computer Engineering, Graduate School of Engineering, Chiba Institute of Technology
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Rehabilitation,Physical Therapy, Sports Therapy and Rehabilitation,General Medicine
Link
https://www.jstage.jst.go.jp/article/nolta/8/2/8_118/_pdf
Reference21 articles.
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2. [2] T. Uruma, N. Satoh, and H. Yamamoto, “Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy,” Japanese Journal of Applied Physics, vol. 55, 2016.
3. [3] J.P. Aimé, R. Boisgard, L. Nony, and G. Couturier, “Nonlinear dynamic behavior of an oscillating tip-microlever system and contrast at the atomic scale,” Physical Review Letters, vol. 82, no. 17, pp. 3388-3391, 1999.
4. [4] S. Hu and A. Raman, “Chaos in atomic force microscopy,” Physical Review Letters, vol. 96, 2006.
5. [5] K. Yamasue, K. Kobayashi, H. Yamada, K. Matsushige, and T. Hikihara, “Controlling Chaos in dynamic-mode atomic force microscope,” Physics Letters A, vol. 373, pp. 3140-3144, 2009.
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