Modeling of Transfer Impedance in Automotive BCI Test System with Closed-Loop Method-Reference-Cited by-同舟云学术

Modeling of Transfer Impedance in Automotive BCI Test System with Closed-Loop Method

Published:2020-04-01 Issue:4 Volume:E103.B Page:405-414
ISSN:0916-8516
Container-title:IEICE Transactions on Communications
language:en
Short-container-title:IEICE Trans. Commun.

Author:

LEE Junesang¹²,LEE Hosang²,HA Jungrae¹,KIM Minho¹,YUN Sangwon¹,KIM Yeongsik¹,NAH Wansoo²

Affiliation:

1. Electronic Braking Systems (EBS) R&D center, MANDO Corp.

2. Department of Electrical and Computer Engineering, Sungkyunkwan University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Software

Link

https://www.jstage.jst.go.jp/article/transcom/E103.B/4/E103.B_2019EBP3144/_pdf

Reference15 articles.

1. [1] Y. Wu and J.G. Chung, “An improved controller area network data-reduction algorithm for in-vehicle networks,” IEICE Trans. Fundamentals, vol.E100-A, no.2, pp.346-352, Feb. 2017. 10.1587/transfun.e100.a.346

2. [2] F. Vanhee, J. Catrysse, and G. Gielen, “The use of BCI techniques regarding immunity testing of modules, as an alternative up to 1GHz,” Proc. International Symposium on EMC, pp.685-688, Kyoto, Japan July 2009.

3. [3] ISO 11452-4, “Road vehicles-Component test methods for electrical disturbances from narrowband radiated electromagnetic energy-Part 4: Bulk current injection (BCI)”. 10.3403/03296836

4. [4] K. Murano, N. Takata, M. Tayarani, F. Xiao, and Y. Kami, “Analysis of transmission line loaded with BCI probe using circuit concept approach,” IEICE Communications Express, vol.4, no.7, pp.223-227, 2015. 10.1587/comex.4.223

5. [5] W. Jung and S. Kim, “BCI probe emulator using a microstrip coupler,” J. Korean Institute of Electromagnetic Engineering and Science, vol.25, no.11, pp.1164-1171, 2014. 10.5515/kjkiees.2014.25.11.1164

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