EBSD Examination of Argon Ion Bombarded Ti-6Al-4V Samples Produced with DMLS Technology

Abstract

Additive manufacturing (AM) indicated great technological increase in the last years. Primarily development of new methods, new computer softwares and more useable materials are responsible for this progression. AM has numerous advantages that cause the appearance of it in almost every field of industry. However this widely spread technology has many under examined properties, especially those, that uses metal as raw material. One of these less understood properties is the behavior of grains during the melting phase and the microstructure after production. The main aim of this study is to examine the microstructure of ion bombarded – using argon - AM produced Ti-6Al-4V samples applying EBDS investigation, measuring the grain size, and the orientation of the grains.