Effect of Resolution on the Wavelength Determination of a Putative Standard to Be Used for near Infrared Diffuse Reflection Spectra Measured on Grating Spectrometers
Author:
Affiliation:
1. Department of Chemistry, University of Idaho, Moscow, ID 83844-2343, USA
2. Bruker Optics Inc., 19 Fortune Drive, Manning Park, Billerica, MA 01821, USA
Abstract
Publisher
SAGE Publications
Subject
Spectroscopy
Link
http://journals.sagepub.com/doi/pdf/10.1255/jnirs.370
Reference5 articles.
1. A WAVELENGTH STANDARD FOR THE NEAR INFRARED BASED ON THE REFLECTANCE OF RARE-EARTH OXIDES
2. Accurate Wavelength Measurements of a Putative Standard for Near-Infrared Diffuse Reflection Spectrometry
3. Effect of Resolution on the Wavenumber Determination of a Putative Standard to Be Used for near Infrared Diffuse Reflection Spectra Measured on Fourier Transform near Infrared Spectrometers
4. Extensive measurements of H_2^16O line frequencies and strengths: 5750 to 7965 cm^−1
5. Smoothing and Differentiation of Data by Simplified Least Squares Procedures.
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