Nature of Carrier Doping in T′-La1.8−xEu0.2SrxCuO4 Studied by X-Ray Photoemission and Absorption Spectroscopy-Reference-Cited by-同舟云学术

Nature of Carrier Doping in T′-La1.8−xEu0.2SrxCuO4 Studied by X-Ray Photoemission and Absorption Spectroscopy

Published:2019-11-15 Issue:11 Volume:88 Page:115004
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Lin Chun¹^ORCID,Horio Masafumi¹^ORCID,Kawamata Takayuki²,Saito Shin²,Koshiishi Keisuke¹,Sakamoto Shoya¹,Zhang Yujun³,Yamamoto Kohei³^ORCID,Ikeda Keisuke³,Hirata Yasuyuki³,Takubo Kou³^ORCID,Wadati Hiroki³^ORCID,Yasui Akira⁴,Takagi Yasumasa⁴,Ikenaga Eiji⁴,Adachi Tadashi⁵^ORCID,Koike Yoji²,Fujimori Atsushi¹⁶^ORCID

Affiliation:

1. Department of Physics, University of Tokyo, Bunkyo, Tokyo 113-0033, Japan

2. Department of Applied Physics, Tohoku University, Sendai 980-8579, Japan

3. Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan

4. Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198, Japan

5. Department of Engineering and Applied Sciences, Sophia University, Chiyoda, Tokyo 102-8554, Japan

6. Department of Applied Physics, Waseda University, Shinjuku, Tokyo 169-8555, Japan

Funder

Japan Society for the Promotion of Science

Publisher

Physical Society of Japan

Subject