One-Sample based Single-Valued Estimation of the Interface Profile from Intersubband Integrated Absorption Intensity Data-Reference-Cited by-同舟云学术

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One-Sample based Single-Valued Estimation of the Interface Profile from Intersubband Integrated Absorption Intensity Data

Published:2016-07-15 Issue:7 Volume:85 Page:074603
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Thao Dinh Nhu¹,Tien Nguyen Thanh²,Toan Huynh Ngoc³,Quang Doan Nhat⁴

Affiliation:

1. College of Education, Hue University, 34 Le Loi Street, Hue City, Vietnam

2. College of Natural Science, Can Tho University, 3-2 Road, Can Tho City, Vietnam

3. Duy Tan University, K7/25 Quang Trung Street, Da Nang City, Vietnam

4. Institute of Physics, Vietnamese Academy of Science and Technology, 10 Dao Tan Street, Hanoi, Vietnam

Publisher

Physical Society of Japan

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.7566/JPSJ.85.074603

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantum beat of excitons in spherical semiconductor quantum dots;Superlattices and Microstructures;2020-10

2. Linear intersubband optical absorption in the semiparabolic quantum wells based on AlN/AlGaN/AlN under a uniform electric field;Physica B: Condensed Matter;2017-08

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