Author:
Shender I.O., ,Pogodin A.I.,Filep M.J.,Malakhovska T.O.,Kokhan O.P.,Bilanych V.S.,Skubenych K.V.,Symkanych O.I.,Izai V.Yu.,Suslikov L.M., , , , , , , , , ,
Abstract
Herein we present the results of microhardness investigations aimed at monocrystalline samples of Ag 7 (Si 1–x Ge x )S 5 I (0, 0.2, 0.4, 0.6, 0.8, 1) and Ag 6+x (P 1–x Ge x )S 5 I (0, 0.25, 0.5, 0.75, 1) solid solutions. The dependence of microhardness H on the load P and composition were investigated. It has been observed that the microhardness dependence on the applied load is characterized by a tendency to decrease with increasing the load. It indicates a presence of “normal” size effect in both Ag 7 (Si 1–x Ge x )S 5 I and Ag 6+x (P 1–x Ge x )S 5 I (0, 0.25, 0.5, 0.75, 1) solid solutions. The revealed size effects of hardness in single crystals of Ag 7 (Si 1–x Ge x )S 5 I and Ag 6+x (P 1-x Ge x )S 5 I solid solutions have been analyzed within the framework of the gradient theory of plasticity. The corresponding parameters of the model of geometrically necessary dislocations have been determined.
Publisher
National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka) (Publications)
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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