Scanning Acoustic Microscopy of Annealing Effects for Aluminium Thin Film Deposited on Silicon Substrate-Reference-Cited by-同舟云学术

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Scanning Acoustic Microscopy of Annealing Effects for Aluminium Thin Film Deposited on Silicon Substrate

Published:2018-12-09 Issue:10 Volume:40 Page:1387-1399
ISSN:1024-1809
Container-title:METALLOFIZIKA I NOVEISHIE TEKHNOLOGII
language:
Short-container-title:Metallofiz. Noveishie Tekhnol.

Author:

Atailia Chafia, ,Deboub Lakhdar,Boudour Amar,Boumaiza Youcef, , ,

Publisher

National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka)

Subject

Metals and Alloys,Condensed Matter Physics,General Mathematics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Acoustic microscope—scanning version

2. Integrated circuits as viewed with an acoustic microscope

3. Acoustic Microscopy

4. A. Briggs, Advances in Acoustic Microscopy (New-York: Plenum Press: 1995).

5. Material Characterization by Line-Focus-Beam Acoustic Microscope

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