Effect of Tin on Structural Transformations in the Thin-Film Silicon Suboxide Matrix-Reference-Cited by-同舟云学术

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Effect of Tin on Structural Transformations in the Thin-Film Silicon Suboxide Matrix

Published:2016-11 Issue:11 Volume:61 Page:980-986
ISSN:2071-0186
Container-title:Ukrainian Journal of Physics
language:
Short-container-title:Ukr. J. Phys.

Author:

Voitovych V.V., ,Rudenko R.M.,Yuchymchuk V.O.,Voitovych M.V.,Krasko M.M.,Kolosiuk A.G.,Povarchuk V.Yu.,Khachevich I.M.,Rudenko M.P., , , , , , , , ,

Publisher

National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka)

Subject

General Physics and Astronomy

Reference28 articles.

1. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

2. Electroluminescence of silicon nanocrystals in MOS structures

3. Si-based materials and devices for light emission in silicon

4. Thermostimulated structural transformations in vacuum-evaporated SiO films.;Lisovskyy;Ukr J Phys,2003

5. Silicon nanoparticles in thermally annealed thin silicon monoxide films

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thermodynamic Theory of Phase Separation in Nonstoichiometric Si Oxide Films Induced by High-Temperature Anneals;Nanomanufacturing;2023-07-03

2. Formation of Nanocrystalline Silicon in Tin-Doped Amorphous Silicon Films;Ukrainian Journal of Physics;2020-03-26

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