Author:
Studenyak I.P., ,Pogodin A.I.,Shender I.A.,Filep M.J.,Kokhan O.P.,Kopčanský P., , , , , ,
Abstract
High-quality single crystals of Ag7(Si1–xGex)S5I (x = 0.2, 0.4, 0.6, 0.8) solid solutions are grown from the solution–melt by vertical zone crystallization method. The measurements of electrical conductivity of Ag7(Si1–xGex)S5I solid solutions were performed using the impedance spectroscopy method within the frequency range from 10 Hz up to 2·106 Hz and temperature interval 293–383 K. Ionic and electronic components of electrical conductivity, as well as their ratios, were determined using the Nyquist plots.
Publisher
National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka) (Publications)
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
7 articles.
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