Modulo Weighted Codes with Summation with the Minimum Number of Undetectable Errors in Data Vectors.

Author:

SAPOZHNIKOV V.V., ,SAPOZHNIKOV Vl.V.,EFANOV D.V., ,

Publisher

National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka)

Reference44 articles.

1. 1. McCluskey, E.J. (1986), Logic design principles: with emphasis on testable semicustom circuits, Prentice Hall PTR, New Jersey, USA.

2. 2. Sogomonyan, E.S. and Slabakov, E.V. (1989), Samoproveryaemye ustroystva i otkazoustoychivye sistemy [Self-checking devices and fault-tolerant systems], Radio i svyaz, Moscow, USSR.

3. 3. Sapozhnikov, V.V. and Sapozhnikov, Vl.V. (1992), Samoproveryaemye diskretnye ustroistva [Self-checking discrete devices], Energoatomizdat, St. Petersburg, Russia.

4. 4. Hurst, S.L. (1998), VLSI testing: digital and mixed analogue/digital techniques (circuits, devices and systems series), 1st edition, The Institution of Engineering and Technology, London, UK.

5. 5. Nicolaidis, M. and Zorian, Y. (1998), On-line testing for VLSI – a compendium of Approaches, Journal of Electronic Testing: Theory and Applications, no. 12, pp. 7-20.

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