A priori probabilistic model for the reliability of an “organised structure”-Reference-Cited by-同舟云学术

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A priori probabilistic model for the reliability of an “organised structure”

Published:2005-10-31 Issue:3 Volume:8 Page:100-105
ISSN:1560-8034
Container-title:Semiconductor physics, quantum electronics and optoelectronics
language:
Short-container-title:Semicond. phys. quantum electron. optoelectron.

Author:

Sal’kov E. A.,

Publisher

National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. 1. V.P. Savchuk, Bayes methods for statistic estimation. Nauka, Moscow (1989).

2. 2. A.A. Chernishov, Reliability of semiconductor devices and integrated circuits. Radio i Svyaz', Moscow (1988).

3. 3. A.M. Yaglom, I.M. Yaglom, Probability and information. Nauka, Moscow (1973).

4. 4. B.V. Gnedenko, Theory of probability. Nauka, Moscow (1969).

5. 5. U.L. Klimontovich, Statistical physics. Nauka, Moscow (1982).

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Information capability of the thermal radiation noise (Analytical overview);Semiconductor physics, quantum electronics and optoelectronics;2008-03-31

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