1. X-ray analysis of thin films and multilayers
2. High-Resolution X-Ray Scattering
3. X-ray diffraction in a perfect crystal with disturbed surface layer
4. V. B. Molodkin, M. V. Koval'chuk, I. M. Karnaukhov, V. F. Machulin, V. E. Storizhko, E. Kh. Mukhamedzhanov, A. I. Nizkova, S. V. Lizunova, E. N. Kislovskiy, S. I. Olikhovskiy, B. V. Sheludchenko, S. V. Dmitriev, E. S. Skakunova, V. V. Molodkin, V. V. Lizunov, V. A. Bushuev, R. N. Kyutt, B. S. Karamurzov, A. A. Dyshekov, T. I. Oranova, and Yu. P. Khapachev, Osnovy Dinamicheskoy Vysokorazreshayushchey Difraktometrii Funktsional'nykh Materialov [Fundamentals of Dynamical High-Resolution Diffractometry of Functional Materials] (Nal'chik: Kabardino-Balkarskiy Universitet: 2013) (in Russian).
5. V. B. Molodkin, M. V. Koval'chuk, I. M. Karnaukhov, V. E. Storizhko, S. V. Lizunova, S. V. Dmitriev, A. I. Nizkova, E. N. Kislovskii, V. V. Molodkin, E. V. Pervak, A. A. Katasonov, V. V. Lizunov, E. S. Skakunova, B. S. Karamurzov, A. A. Dyshekov, A. N. Bagov, T. I. Oranova, and Yu. P. Khapachev, Osnovy Integral'noy Mnogoparametricheskoy Diffuznodinamicheskoy Difraktometrii [Fundamentals of Integrated Multiparametric Diffuse-Dynamical Diffractometry] (Nal'chik: Kabardino-Balkarskiy Universitet: 2013) (in Russian).