Author:
Sachenko A.V., ,Konakova R.V.,Belyaev A.E.,
Publisher
National Academy of Sciences of Ukraine (Co. LTD Ukrinformnauka)
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference28 articles.
1. Correlation between microstructure and temperature dependent electrical behavior of annealed Ti/Al/Ni/Au ohmic contacts to AlGaN/GaN heterostructures.;Iucolano;Appl Phys Lett,2013
2. A computer method for the characterization of surface-layer ohmic contacts.;Brezeanu;Solid-State Electron,1987
3. 80. Ion Implantation and Beam Processing, Eds. J.S. Williams, J.M. Poate. Academic Press, N.Y., 1984.
4. 81. Henisch H.K. Metal Rectifiers. Clarendon, Oxford, 1949. Chap. 5. P. 51.
5. 82. Pikus G.E. Fundamentals of the Theory of Semiconductor Devices. Moscow, Nauka, 1965. Chap. 2. P. 38 (in Russian).
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