Multi-pulse modulation method in photothermal atomic force microscopy for variable frequency modulation of incident light-Reference-Cited by-同舟云学术

Multi-pulse modulation method in photothermal atomic force microscopy for variable frequency modulation of incident light

Published:2021-04-14 Issue:SE Volume:60 Page:SE1003
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Yamada Ayaka,Takahashi Takuji^ORCID

Abstract

Abstract Photothermal atomic force microscopy (PT-AFM) enables us to examine non-radiative recombination property with high spatial resolution. In order to realize variable frequency modulation of incident light in PT-AFM, we have proposed a multi-pulse modulation method, where the duration for light illumination is divided into multiple light pulses and their period is varied. We have assessed the validity of the proposed method through acquisition of photothermal signal images on microcrystalline materials under various modulation frequencies.

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

https://iopscience.iop.org/article/10.35848/1347-4065/abf07b/pdf

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