Photoelectron holographic evidence for the incorporation site of Se and suppressed atomic displacement of the conducting layer of La(O,F)BiSSe

Author:

Li YaJun,Sun ZeXu,Kataoka Noriyuki,Setoguchi Taro,Hashimoto Yusuke,Takeuchi Soichiro,Koga Shunjo,Hoshi Kazuhisa,Mizuguchi Yoshikazu,Matsushita Tomohiro,Wakita Takanori,Muraoka Yuji,Yokoya TakayoshiORCID

Abstract

Abstract La(O,F)BiS2-x Se x is a layered material that is considered to be a candidate exotic superconductor as well as a promising thermoelectrical material. We performed soft X-ray photoelectron holography to study the Se incorporation site and the local atomic arrangement of the conducting layer. A comparison of the experimental holograms with the simulated holograms indicates that Se atoms preferentially occupy the S sites in the conducting Bi–S plane of La(O,F)BiS2. A comparison between the state-of-the-art holographic reconstructions of La(O,F)BiSSe and La(O,F)BiS2 suggests that Se substitution suppresses the displacement of S atoms in La(O,F)BiS2. These results provide photoelectron holographic evidence for the Se incorporation site and the Se-induced suppression of in-plane disorder.

Funder

Japan Society for the Promotion of Science

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

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