Surface morphology of naphtacene single crystals grown by the physical vapor transport technique

Abstract

Abstract The surface morphology of naphtacene single crystals grown by the physical vapor transport technique was investigated by atomic force microscopy and white-beam X-ray topography. Locally, two types of line pattern were observed on the basal (001) plane along the [110] and [010] directions, and analyzed from crystallographic viewpoints. Such line patterns are considered in relation to crystallographic periodicities, dislocation lines, and slip-plane phenomena.