Abstract
Abstract
In this work, the effect of gamma irradiation on the quasi-vertical GaN Schottky barrier diodes with a passivation layer was investigated for the first time. The forward I–V characteristic was improved and the reverse leakage was slightly increased after 1 Mrad gamma irradiation. Moreover, the annealing process was carried out after the irradiation. The leakage current was recovered while the forward current continued to increase after the annealing. Then a possible mechanism based on the effect of gamma irradiation on passivation film was proposed to explain the annealing behavior of the passivated device.
Funder
National Science Fund for Distinguished Young Scholars
National Natural Science Foundation of China
National Key Research and Development Program of China
Subject
General Physics and Astronomy,General Engineering