Time-resolved measurement of radical populations in extreme-ultraviolet-light-induced hydrogen plasma

Author:

Liu ChangORCID,Tanaka NozomiORCID,Zhu BaojunORCID,Nishihara KatsunobuORCID,Fujioka ShinsukeORCID,Sik Kang Kyung,Suh Youngduk,Kim Jeong-Gil,Ozawa Ken,Kubo Minoru

Abstract

Abstract We have investigated hydrogen plasma induced by intense extreme ultraviolet (EUV) radiation by measuring the plasma parameters and population density of radicals, which is expected to clean the tin contamination on the optics in EUV sources, using a time-resolved optical emission spectroscopy. The obtained electron density was n e = (2 ± 0.4) × 1013 cm−3, and the electron temperature was T e = 1 ± 0.2 eV. The electron density was five orders of magnitude higher than that of previous study. The radical population density determined by the experiment was consistent with that calculated with a collisional radiative model, showing excitation and recombination are dominant production processes.

Funder

Japan Society for the Promotion of Science

Samsung R&D Institute Japan

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

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