Author:
Harada Ken,Akashi Tetsuya,Takahashi Yoshio,Kodama Tetsuji,Shimada Keiko,Ono Yoshimasa A.,Mori Shigeo
Abstract
Abstract
In an electron double-slit experiment, an optically zero propagation distance condition (infocus imaging condition), in which the double-slit position was imaged just on the detector plane (image plane), was realized in a 1.2 MV field-emission transmission electron microscope. Interference fringes composed of dot images were controlled by using two electron biprisms. Using a V-shaped double slit, we observed the interference features under the pre-interference condition, interference condition and post-interference condition of electron waves. We conclude that it is possible to observe the interference fringes only when the path information of the individual electrons is not available.
Funder
KAKENHI, Grant-in-Aid for Scientific Research
Subject
General Physics and Astronomy,General Engineering
Cited by
4 articles.
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