Effect of scanning speed on AFM height images and 3D surface texture parameters explored on smooth and rough polymer surfaces

Abstract

Atomic force microscopy (AFM) is a powerfull technique developed in the last decades that is widely used for surface morphology investigation at micro and nanometric scale. Along with the environment in which the scan is performed and the type of sample, the scanning conditions play an important role in obtaining the best results in imaging, without any artifacts that may be occure. In the present study, in order to establish the proper scanning conditions, smooth and rough polymer surfaces were used to investigate the influence of the scanning speed on height images and amplitude, hybrid, spatial, and functional 3D surface texture parameters in atomic force microscopy.