Affiliation:
1. Department of Electronics, J.D.M.V.P. Co-Operative Samaj’s Arts, Commerce and Science College, Jalgaon-425301, India
Abstract
Pure and tellurium-doped ZnO nanostructure films were prepared on microscopic glass substrates
using the sol-gel method and investigated the relationship between the structural, morphological,
roughness, and optical properties. The X-ray diffraction (XRD) spectra revealed that the nanostructure
films have a hexagonal Wurtzite structure. The field emission scanning electron microscope (FESEM)
images showed that the surface morphology of the nanostructure films was modified due to the Te
dopant. The atomic force microscopy (AFM) technique was used to study the surface roughness of the
pure ZnO and Te-doped ZnO deposited films. The optical properties of the nanostructure films were
obtained using the ultraviolet-visible spectrophotometer. The effects of Te dopant elements on the
optical characteristics and the samples’ energy band gaps were calculated and discussed.
Publisher
Asian Journal of Chemistry