Nanometer-Scale Manipulation and Ultrasonic Cutting Using an Atomic Force Microscope Controlled by a Haptic Device as a Human Interface-Reference-Cited by-同舟云学术

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Nanometer-Scale Manipulation and Ultrasonic Cutting Using an Atomic Force Microscope Controlled by a Haptic Device as a Human Interface

Published:2008-07-18 Issue:7 Volume:47 Page:6181-6185
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Iwata Futoshi,Ohara Kouhei,Ishizu Yuichi,Sasaki Akira,Aoyama Hisayuki,Ushiki Tatsuo

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference14 articles.

1. Submicrometer modification of polymer surfaces with a surface force microscope

2. Sub-20 nm Scratch Nanolithography for Si Using Scanning Probe Microscopy

3. Nanolithography with an atomic force microscope by means of vector-scan controlled dynamic plowing

4. Nanoscale patterning of Si(100) surfaces by scratching through the native oxide layer using atomic force microscope

5. Local elasticity imaging of nano bundle structure of polycarbonate surface using atomic force microscopy

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3. Microtubule self-healing and defect creation investigated by in-line force measurements during high-speed atomic force microscopy imaging;Nanoscale;2019

4. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate;Journal of Applied Physics;2015-10-07

5. Development of Nano-manipulator based on An Atomic Force Microscopy coupled with a Haptic Device;The Journal of The Institute of Electrical Engineers of Japan;2014

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