Resonant Inelastic X-ray Scattering of EuNi2(Si1-xGex)2and Eu2O3at EuL3Absorption Edge-Reference-Cited by-同舟云学术

Resonant Inelastic X-ray Scattering of EuNi2(Si1-xGex)2and Eu2O3at EuL3Absorption Edge

Published:2006-03-15 Issue:3 Volume:75 Page:034702
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Yamaoka H.¹,Taguchi M.¹,M. Vlaicu A.²,Oohashi H.³,Yokoi K.³,Horiguchi D.³,Tochio T.³,Ito Y.³,Kawatsura K.⁴,Yamamoto K.¹⁵,Chainani A.¹,Shin S.¹,Shiga M.⁶,Wada H.⁷

Affiliation:

1. RIKEN SPring-8 Center (The Institute of Physical and Chemical Research), 1-1-1 Kouto, Sayo, Hyogo 679-5148

2. Harima Office, National Institute for Materials Science, 1-1-1 Kouto, Mikazuki, Sayo, Hyogo 679-5143

3. Institute of Chemical Research, Kyoto University, Uji, Kyoto 606-8501

4. Kyoto Institute of Technology, Matsugasaki, Sakyo, Kyoto 606-8585

5. Graduate School of Engineering, Osaka Prefecture University, Sakai, Osaka 599-8531

6. Kyoto University, Sakyo, Kyoto 606-8585

7. Kyushu University, Hakozaki, Higashi, Fukuoka 812-8581

Publisher

Japan Society of Applied Physics

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.1143/JPSJ.75.034702

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