Author:
Hoffman Richard W.,Ramer Jeff,Li Sherman
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
2 articles.
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1. Optical Diagnostics for Thin Film Processing;Annual Review of Physical Chemistry;2003-10
2. Thin film and emissivity effects on radiometric temperature measurement accuracy;11th IEEE International Conference on Advanced Thermal Processing of Semiconductors. RTP 2003