An X-Ray Diffraction Study of Martensitic Transformation in Ti-Doped Nb3Sn-Reference-Cited by-同舟云学术

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An X-Ray Diffraction Study of Martensitic Transformation in Ti-Doped Nb3Sn

Published:1988-12-20 Issue:Part 1, No. 12 Volume:27 Page:2218-2223
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Watanabe Yousuke,Toyota Naoki,Inoue Tetsuo,Komatsu Hiroshi,Iwasaki Hiroshi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The effects of disorder on the normal state and superconducting properties of Nb3Sn;Superconductor Science and Technology;2016-12-13

2. Direct observation of Nb3Sn lattice deformation by high-energy x-ray diffraction in internal-tin wires subject to mechanical loads at 4.2 K;Superconductor Science and Technology;2012-04-23

3. Reversible stress-induced anomalies in the strain function of Nb3Sn wires;Superconductor Science and Technology;2012-01-10

4. Evidence that the upper critical field of Nb3Sn is independent of whether it is cubic or tetragonal;Applied Physics Letters;2011-09-19

5. Temperature dependence of the lattice constant in metallic sodium;Journal of Applied Crystallography;1994-12-01

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