Characterization of Domain-Inverted Layers in LiTaO 3 by Line-Focus-Beam Acoustic Microscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Acoustic Microscopy Applied to NanoStructured Thin Film Systems;Modern Aspects of Electrochemistry;2009
2. Quantitative characterization of the fabrication processes of domain-inverted layers in LiTaO3 by the line-focus-beam ultrasonic material characterization system;Journal of Applied Physics;2002-10
3. Evaluation of the annealing effect of proton-exchanged LiTaO3 optical waveguides by the line-focus-beam ultrasonic material characterization system;Journal of Applied Physics;2002-09
4. Scanning Acoustic Microscopy;Encyclopedia of Imaging Science and Technology;2002-01-15
5. Quantitative evaluation of fabrication processes of proton-exchanged layers in LiTaO3 optoelectronic devices by the line-focus-beam ultrasonic material characterization system;Journal of Applied Physics;2001-02-15
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