Experimental Setup forin SituInvestigation of Phase Changing Behavior in Phase-Change Random-Access Memory Medium by Microfocusing Nanosecond-Time-Resolved Ellipsometry-Reference-Cited by-同舟云学术

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Experimental Setup forin SituInvestigation of Phase Changing Behavior in Phase-Change Random-Access Memory Medium by Microfocusing Nanosecond-Time-Resolved Ellipsometry

Published:2006-08-04 Issue:8A Volume:45 Page:6452-6454
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kim Younhwa,Kim Sang Jun,Kim Sang Youl,An Sung Hyuck,Suh Dong-Seok,Noh Jin-Seo,Lee Sang Mock,Kim Kijoon H. P.,Shin Woong-Chul,Khang Yoonho

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical and Electrical Properties of Phase Change Materials;Phase Change Materials;2009

2. High-Temperature Complex Refractive Index of Phase Change Recording Medium of Ge2Sb2Te5Determined Using Phase Change Static Tester and Spectroscopic Ellipsometer;Japanese Journal of Applied Physics;2008-07-11

3. Optical Property of Super-RENS Optical Recording Ge2Sb2Te5Thin Films at High Temperature;Hankook Kwanghak Hoeji;2007-10-25

4. Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elements;Applied Optics;2007-07-06

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