Author:
Nakajima Kunio,Aoki Sadao,Sudo Shuzo,Mondo Munehiro,Kudo Hiroshi,Fujiwara Shiro,Arai Toshihiro
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Accuracy of thickness measurement for Ge epilayers grown on SiGe/Ge/Si(100) heterostructure by x-ray diffraction and reflectivity;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2011-01
2. Electrodeposition of nanometer-thick ceria films by oxidation of cerium(III)–acetate;Solid State Ionics;2007-05-15
3. Density of thin TiO2 films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-06
4. Oxidation of epitaxial Fe films monitored by x-ray reflectivity;Journal of Materials Research;1994-04