Fabrication and Characteristics of a Submillimeter Detector Element Formed on a CdTe Single-Crystal Wafer as a Multichannel Detector Array Applicable to Diagnostic Imaging with Energy Information-Reference-Cited by-同舟云学术

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Fabrication and Characteristics of a Submillimeter Detector Element Formed on a CdTe Single-Crystal Wafer as a Multichannel Detector Array Applicable to Diagnostic Imaging with Energy Information

Published:1993-01-15 Issue:Part 1, No. 1A Volume:32 Page:228-233
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Tsutsui Hiroshi,Ohtsuchi Tetsuro,Ohmori Koichi,Baba Sueki

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Comparative study of HgxCd1−xTe films grown on CdTe thin films previously deposited from two different techniques;Journal of Crystal Growth;2009-04

3. An Efficient, Novel Microstrip Collector Architecture for Digital Radiographic Imaging CZT Semiconductor Sensors;IEEE Transactions on Instrumentation and Measurement;2005-06

4. Intrinsic sensitivity of Cd/sub 1-x/Zn/sub x/Te semiconductors for digital radiographic imaging;IEEE Transactions on Instrumentation and Measurement;2003-10

5. Medical applications of CdTe and CdZnTe detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2001-02

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