A New Fabrication Process of Superconducting Nb Tunnel Junctions with Ultralow Leakage Current for X-Ray Detection-Reference-Cited by-同舟云学术

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A New Fabrication Process of Superconducting Nb Tunnel Junctions with Ultralow Leakage Current for X-Ray Detection

Published:1993-10-15 Issue:Part 1, No. 10 Volume:32 Page:4535-4537
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Nakagawa Hiroshi,Pepe Gianpiero,Akoh Hiroshi,Frunzio Luigi,Cristiano Roberto,Esposito Emanuela,Pagano Sergio,Peluso Giuseppe,Barone Antonio,Takada Susumu

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 40 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Local flux-flow instability in superconducting films near Tc;Physical Review B;2019-05-29

2. Subgap Tunneling Current at Low Temperature in Nb/Al-AlN/Nb SIS Junctions;IEEE Transactions on Applied Superconductivity;2011-06

3. Fiske steps and Abrikosov vortices in Josephson tunnel junctions;Physical Review B;2010-05-10

4. Contribution of the imaginary part of the superconducting gap energy on the SIS tunneling current;Physica C: Superconductivity;2009-10

5. X-ray detection by an on-chip coil integrated superconducting tunnel junction;Review of Scientific Instruments;2003-07

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