Electrical Characteristics and Reliability of Pt/Ti/Pt/Au Ohmic Contacts to p-Type GaAs-Reference-Cited by-同舟云学术

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Electrical Characteristics and Reliability of Pt/Ti/Pt/Au Ohmic Contacts to p-Type GaAs

Published:1991-04-01 Issue:Part 2, No. 4A Volume:30 Page:L558-L560
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Okada Hiroyuki,Shikata Shin-ichi,Hayashi Hideki

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 35 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Microstructural and phase evolutions of Pt contact to N-type In0.53Ga0.47As driven by rapid thermal annealing and its correlation with specific contact resistivity;Intermetallics;2021-06

2. Optimization of Ohmic Contacts to p-GaAs Nanowires;Nanoscale Research Letters;2019-11-14

3. Single GaAs Nanowire/Graphene Hybrid Devices Fabricated by a Position-Controlled Microtransfer and an Imprinting Technique for an Embedded Structure;ACS Applied Materials & Interfaces;2019-03-20

4. Effect of annealing temperature on the characteristics of Pt/CH3NH3PbI3 contact;Journal of Crystal Growth;2019-01

5. Novel Sn-Based Contact Structure for GeTe Phase Change Materials;ACS Applied Materials & Interfaces;2018-04-18

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