Two-ColorReflection Multilayers for He-I and He-II Resonance Lines for Microscopic Ultraviolet Photoelectron Spectroscopy Using Schwarzschild Objective-Reference-Cited by-同舟云学术

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Two-ColorReflection Multilayers for He-I and He-II Resonance Lines for Microscopic Ultraviolet Photoelectron Spectroscopy Using Schwarzschild Objective

Published:2001-01-15 Issue:Part 1, No. 1 Volume:40 Page:376-379
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Ejima Takeo,Kondo Yuzi,Watanabe Makoto

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics;Applied Physics Reviews;2017-03

3. Multilayer Mirrors for Coherent Extreme-Ultraviolet and Soft X-ray Sources;Springer Series in Optical Sciences;2015

4. Corrosion-resistant Mg/SiC multilayer coatings for EUV laser sources in the 25-80nm wavelength region;X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X;2013-09-27

5. Triple-wavelength, narrowband Mg/SiC multilayers with corrosion barriers and high peak reflectance in the 25-80 nm wavelength region;Optics Express;2012-10-05

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