Ultrasonic Microspectroscopy Characterization of AlN Single Crystals
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering
Link
http://stacks.iop.org/1882-0786/1/i=7/a=077004/pdf
Reference16 articles.
1. An aluminium nitride light-emitting diode with a wavelength of 210 nanometres
2. Zero-Temperature-Coefficient SAW Devices on AlN Epitaxial Films
3. Similarities and differences in sublimation growth of SiC and AlN
4. Vibrational Spectroscopy of Aluminum Nitride
5. Surface acoustic wave velocity in single-crystal AlN substrates
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