Development of Picosecond Time-Resolved Microbeam X-ray Diffraction Technique for Investigation of Optical Recording Process-Reference-Cited by-同舟云学术

Development of Picosecond Time-Resolved Microbeam X-ray Diffraction Technique for Investigation of Optical Recording Process

Published:2009-03-23 Issue:3 Volume:48 Page:03A001
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Tanaka Yoshihito,Fukuyama Yoshimitsu,Yasuda Nobuhiro,Kim Jungeun,Murayama Haruno,Kohara Shinji,Osawa Hitoshi,Nakagawa Takeshi,Kimura Shigeru,Kato Kenich,Yoshida Fumiko,Kamioka Hayato,Moritomo Yutaka,Matsunaga Toshiyuki,Kojima Rie,Yamada Noboru,Toriumi Koshiro,Ohshima Takashi,Tanaka Hitoshi,Takata Masaki

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

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