Author:
Sayama Hirokazu,Hara Shigenori,Kimura Hiroshi,Ohno Yoshikazu,Satoh Shinichi,Takai Mikio
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
13 articles.
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1. Suppression of charge carrier collection in diode with retrograde well and epitaxial layers for soft-error immunity;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
2. Recent applications of nuclear microprobe techniques to microelectronics;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
3. Application of medium energy nuclear microprobe to semiconductor process steps;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09
4. Applications of nuclear microprobes in the semiconductor industry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-06
5. Soft error susceptibility and immune structures in dynamic random access memories (DRAMs) investigated by nuclear microprobes;IEEE Transactions on Nuclear Science;1996-04