Fabrication of Buried Metal Dot Structure in Split-Gate Wire by Scanning Tunneling Microscope-Reference-Cited by-同舟云学术

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Fabrication of Buried Metal Dot Structure in Split-Gate Wire by Scanning Tunneling Microscope

Published:1996-06-30 Issue:Part 1, No. 6B Volume:35 Page:3738-3742
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Aoki Nobuyuki,Fukuhara Keizo,Kikutani Tomoyuki,Oki Akio,Hori Hidenobu,Yamada Syoji

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tip-based nanomanufacturing by electrical, chemical, mechanical and thermal processes;CIRP Annals;2010

2. Advanced Growth Techniques of InAs-system Quantum Dots for Integrated Nanophotonic Circuits;Handbook of Self Assembled Semiconductor Nanostructures for Novel Devices in Photonics and Electronics;2008

3. Nano-probe-assisted technology of indium-nano-dot formation for site-controlled InAs/GaAs quantum dots;Physica E: Low-dimensional Systems and Nanostructures;2004-03

4. Conductance steps observed in adiabatic ferromagnetic quantum-dot point contacts made in theIn0.5Ga0.5As/In0.5Al0.5Asheterojunction;Physical Review B;2000-04-15

5. Cross-Sectional Transmission Electron Microscope Observation of Small Structures Made by Field-Induced Scanning Tunneling Microscope Fabrication;Japanese Journal of Applied Physics;1999-06-30

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