Auger Electron and X-Ray Photoelectron Spectroscopy Studies of Oxidation of Tin UsingSnOxThin Films Grown by Reactive Ion-Assisted Deposition-Reference-Cited by-同舟云学术

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Auger Electron and X-Ray Photoelectron Spectroscopy Studies of Oxidation of Tin UsingSnOxThin Films Grown by Reactive Ion-Assisted Deposition

Published:1996-11-15 Issue:Part 1, No. 11 Volume:35 Page:5820-5824
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Choi Won-Kook,Cho Jun-Sik,Song Seok-Kyun,Jung Hyung-Jin,Koh Seok-Keun

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Phosphorus doped SnO2 thin films for transparent conducting oxide applications: synthesis, optoelectronic properties and computational models;Chemical Science;2018

4. Scaling aerosol assisted chemical vapour deposition: Exploring the relationship between growth rate and film properties;Materials & Design;2017-09

5. Electronic structure of undoped and doped SnOx nanolayers;Thin Solid Films;2013-06

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