Electron-Beam Electroreflectance Spectroscopy of Semiconductors
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Study of semiconductor surfaces and interfaces using electromodulation;Surface and Interface Analysis;2001
2. Optical characterization of synthetic diamond films;Fourth International Conference on Thin Film Physics and Applications;2000-11-29
3. Photoreflectance study of crystalline silicon;Materials Science and Engineering: B;2000-07
4. Photoacoustic spectra of zincselenide thin films grown by molecular beam epitaxy;Microelectronic Engineering;1998-08
5. Deep levels in ZnSe epitaxial layers examined by piezoelectric photoacoustic spectroscopy;Journal of Crystal Growth;1998-02
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