Simulation Studies of a Composition Analysis by Thickness-Fringe (CAT) in an Electron Microscope Image of GaAs/AlxGa1-xAs Superstructure
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 58 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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4. Compositional analysis of graded Al[sub x]Ga[sub (1−x)]As layers by x-ray energy dispersive spectrometry;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2004
5. Determination of Al compositional profiles across AlAs/GaAs heterostructural interface at sub-nanometer spatial resolution by thickness fringe imaging;Scripta Materialia;2002-08
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