Simultaneous Analysis of Total Reflection X-Ray Diffraction and Fluorescence from Copper-Phthalocyanine Thin Films during Evaporation Process
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Silicon phthalocyanine: Vapor pressure and photovoltaic properties;Synthetic Metals;2020-08
2. Trends and Future Prospects;Total-Reflection X-Ray Fluorescence Analysis and Related Methods;2014-12-19
3. Phthalocyanine Composites as High-Mobility Semiconductors for Organic Thin-Film Transistors;Advanced Materials;2005-05-02
4. Mixed crystal phthalocyanine films;Crystal Engineering;2003-03
5. Grazing Incidence In-Plane X-Ray Diffraction Study on Oriented Copper Phthalocyanine Thin Films;Japanese Journal of Applied Physics;2002-08-15
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