X-Ray Reflectivity Study of Interdiffusion at YBa2Cu3O7-xand Metal Interfaces-Reference-Cited by-同舟云学术

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X-Ray Reflectivity Study of Interdiffusion at YBa2Cu3O7-xand Metal Interfaces

Published:2003-03-15 Issue:Part 1, No. 3 Volume:42 Page:1395-1399
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Han S.-W.,Tripathy S.,Miceli P. F.,Badica E.,Covington M.,Greene L. H.,Aprili M.

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/42/i=3R/a=1395/pdf

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Epitaxial growth of oriented CoO films by radio-frequency sputtering deposition;Vacuum;2023-11

2. Direct comparison of the electrical, optical, and structural phase transitions of VO2 on ZnO nanostructures;Current Applied Physics;2022-04

3. The in-plane magnetic anisotropy in manganite film: A novel magnetic anisotropy induced by structural anisotropy;AIP Advances;2020-09-01

4. Atomic interdiffusion in Pt-Ni thin films at low temperatures: An in-situ X-ray reflectivity study;Thin Solid Films;2019-11

5. Micro-Structural Properties of YBa₂Cu₃O_7−x/ZnO Nanorods on SrTiO₃;Journal of Nanoscience and Nanotechnology;2015-01-01

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