Electronic States Localized at Surface Defects on Cu(755) Studied by Angle-Resolved Ultraviolet Photoelectron Spectroscopy Using Synchrotron Radiation
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Published:2003-07-30
Issue:Part 1, No. 7B
Volume:42
Page:4684-4687
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:en
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Ogawa Koji,Nakanishi Koji,Namba Hidetoshi
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering