Observation of OMVPE-Grown GaInP/GaAs Cross-Sections by Transmission Electron Microscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Chapter 5 AlGalnP Light-Emitting Diodes;Semiconductors and Semimetals;1997
2. AlGaInP QUANTUM WELL LASERS;Quantum Well Lasers;1993
3. Growth and characterization of high‐quality In0.32Ga0.68P layers on GaAs0.61P0.39substrates by liquid‐phase epitaxy;Journal of Applied Physics;1991-07-15
4. Use of a valved, solid phosphorus source for the growth of Ga0.5In0.5P and Al0.5In0.5P by molecular beam epitaxy;Applied Physics Letters;1991-07-15
5. The characterization of misfit dislocations at {100} heterojunctions in III–V compound semiconductors;Acta Metallurgica;1989-10
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