Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-Ray Diffraction Method with Sub-µm Spatial Resolution-Reference-Cited by-同舟云学术

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Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-Ray Diffraction Method with Sub-µm Spatial Resolution

Published:2002-09-15 Issue:Part 2, No. 9A/B Volume:41 Page:L1013-L1015
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kimura Shigeru,Kagoshima Yasushi,Kobayashi Kenji,Izumi Koichi,Sakata Yasutaka,Sudo Sinya,Yokoyama Yoshiyuki,Niimi Toshihiro,Tsusaka Yoshiyuki,Matsui Junji

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/41/i=9A/a=L1013/pdf

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evidence of lattice tilt and slip in m-plane InGaN/GaN heterostructure;Applied Physics Letters;2011-09-26

2. Liquid-crystal periodic zigzags from geometrical and surface-anchoring-induced confinement: Origin and internal structure from mesoscopic scale to molecular level;Physical Review E;2010-10-15

3. Microarea strain analysis in GaN-based laser diodes using high-resolution microbeam X-ray diffraction;physica status solidi (b);2010-06-23

4. Simple estimation of strain distribution in narrow-stripe waveguide array fabricated by selective MOVPE;Journal of Crystal Growth;2007-01

5. Development of High-Angular-Resolution Microdiffraction System for Reciprocal Space Map Measurements;Japanese Journal of Applied Physics;2006-09-29

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