Ferroelectric Properties of Very Thin Pb(Zr0.4Ti0.6)O3Film Determined by Kelvin Force Microscope-Reference-Cited by-同舟云学术

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Ferroelectric Properties of Very Thin Pb(Zr0.4Ti0.6)O3Film Determined by Kelvin Force Microscope

Published:2002-11-30 Issue:Part 1, No. 11B Volume:41 Page:6739-6742
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Jang Dongmin,Heo Jinhee,Yi Insook,Chung Ilsub

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/41/i=11S/a=6739/pdf

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Mixed Triboelectric and Flexoelectric Charge Transfer at the Nanoscale;Advanced Science;2021-08-13

2. Surface-screening mechanisms in ferroelectric thin films and their effect on polarization dynamics and domain structures;Reports on Progress in Physics;2018-01-25

3. Domain structure, local surface potential distribution and relaxation of Pb(Zn1/3Nb2/3)O3–9%PbTiO3 (PZN–9%PT) single crystals;Journal of Materiomics;2016-12

4. Electrostatic and Kelvin Probe Force Microscopy for Domain Imaging of Ferroic Systems;Nanoscale Ferroelectrics and Multiferroics;2016-03-25

5. Effect of local surface potential distribution on its relaxation in polycrystalline ferroelectric films;Journal of Applied Physics;2010-03

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