Precise Magnetization Measurements of Single-Crystalline FeSi under High Pressure-Reference-Cited by-同舟云学术

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Precise Magnetization Measurements of Single-Crystalline FeSi under High Pressure

Published:1999-05-15 Issue:5 Volume:68 Page:1693-1698
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Koyama Keiichi¹,Goto Tsuneaki¹,Kanomata Takeshi²,Note Ryunosuke³

Affiliation:

1. Institute for Solid State Physics, University of Tokyo, Roppongi, Minato-ku, Tokyo 106-8666

2. Faculty of Engineering, Tohoku Gakuin University, Tagajo 985-8537

3. Institute for Materials Research, Tohoku University, Katahira, Aoba-ku, Sendai 980-8577

Publisher

Physical Society of Japan

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.1143/JPSJ.68.1693

Cited by 39 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Magnetoconduction in the Correlated Semiconductor FeSi in Ultrastrong Magnetic Fields up to a Semiconductor-to-Metal Transition;Physical Review Letters;2021-10-06

2. Understanding the temperature- and pressure-dependent electronic properties of FeSi: DFT + DMFT study;Europhysics Letters;2020-11-01

3. Magnetic Measurements of Narrow-Gap Semiconductor FeSb₂ under High Pressure;MATERIALS TRANSACTIONS;2020-07-01

4. Evidence for a conducting surface ground state in high-quality single crystalline FeSi;Proceedings of the National Academy of Sciences;2018-08-06

5. Thermoelectricity in correlated narrow-gap semiconductors;Journal of Physics: Condensed Matter;2018-04-10

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