In SituX-Ray Topographic Study of Sweeping of Impurity Ions in Quartz Crystals
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Published:1999-07-15
Issue:Part 1, No. 7A
Volume:38
Page:4142-4146
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:en
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Sebastian M. T.,Becker R. A.,Klapper andH.
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering