Applicability of the Soft X-Ray Standing-Wave Method to Surface Structure Determination-Reference-Cited by-同舟云学术

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Applicability of the Soft X-Ray Standing-Wave Method to Surface Structure Determination

Published:1989-09-20 Issue:Part 2, No. 9 Volume:28 Page:L1637-L1640
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Yokoyama Toshihiko,Takata Yasutaka,Yoshiki Masahiko,Ohta Toshiaki,Funabashi Manabu,Kitajima Yoshinori,Kuroda Haruo

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface structure determination using x-ray standing waves;Reports on Progress in Physics;2005-03-09

2. Total-Electron-Yield X-Ray Standing-Wave Measurements of Multilayer X-Ray Mirrors for Interface Structure Evaluation;Japanese Journal of Applied Physics;2002-06-30

3. Site-Selective EXAFS in Mixed-Valence Compounds Using High-Resolution Fluorescence Detection: A Study of Iron in Prussian Blue;Inorganic Chemistry;2002-05-21

4. The structures of sulphur on Pd(111) studied by X-ray standing wavefield absorption and surface EXAFS;Surface Science;1998-08

5. The structure of (√3 × √3)R30°-sulphur on Rh(111) surface studied by X-ray standing wavefield absorption and surface EXAFS;Surface Science;1997-10

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