Measurements of Copper Phthalocyanine Ultrathin Films by Scanning Tunneling Microscopy and Spectroscopy-Reference-Cited by-同舟云学术

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Measurements of Copper Phthalocyanine Ultrathin Films by Scanning Tunneling Microscopy and Spectroscopy

Published:1989-08-20 Issue:Part 2, No. 8 Volume:28 Page:L1460-L1463
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Mizutani Wataru,Sakakibara Youichi,Ono Masatoshi,Tanishima Satoshi,Ohno Kousuke,Toshima Naoki

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Phthalocyanine Thin Films: Deposition and Structural Studies;The Porphyrin Handbook;2003

2. Atomic Resolution of Porphyrins: Single-Molecule Observations of Porphyrinoid Compounds by Scanning Tunneling Microscopy;Springer Series in Chemical Physics;2003

3. Scanning Force Microscopy Study of Ultrathin Films of Nickel-Phthalocyanine on Graphite;Surface Review and Letters;1998-02

4. Low-Energy Electron Transmission Spectroscopy of Thin Films of Chloroaluminum Phthalocyanine onMoS2;Japanese Journal of Applied Physics;1997-09-15

5. Thin and ultra-thin films of nickel phthalocyanine grown on highly oriented pyrolitic graphite: an XPS, UHV-AFM and air tapping-mode AFM study;Surface Science;1997-03

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